FEI Quanta 200F integrated with Oxford-EDS system IE 250 X Max 80, Netherlands
Features
Performance
Three vacuum modes - High, Low and ESEM modes
Samples can be studied in pressures up to 5 Torr
BSED, ETD, LFD and STEM detector are also incorporated
The Wet SEM provides imaging at relative humidity conditions up to 100%
Manual user interface EDS with 80 mm2 SDD detector can be used in three modes: point & ID, analyzer and mapping
Resolution: 2 nm
Applications
Surface morphology of all kinds of conductive and non-conductive samples including nano to micro scale structures, films, ceramics etc. can be analyzed
Texture information by performing phase identification through BSED
Elemental detection and orientation mapping can be done by EDS
Sample Specifications
Conductive and non-conductive solid samples can be analyzed
Non-conductive samples can be analyzed under low vacuum mode or must be sputter coated either with gold, platinum or silver for high vacuum mode
Gel and liquid samples can also be analyzed using Peltier stage under different conditions
Height: 1 - 1.5 cm
Minimum amount required for analysis
5 mg for powder sample
1X1 cm2 for films
100 µl for liquid sample
Testing Parameters
Magnification: 50X to approx 200,000X depending on the nature of the sample
Voltage: 2 kV to 30 kV
Parameters may vary depending upon the nature of the sample
Points to be noted
Samples should not be toxic, reactive or volatile in nature
Sample should be well dispersed and vacuum dried
Location: SMITA Analytical Lab, TX-110 A, Dept. of Textile Technology, IIT Delhi