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Secondary Ion Mass Spectrometry (SIMS)

Secondary Ion Mass Spectrometer, Millbrook, UK


he Millbrook Mini SIMS Alpha is a bench-top Secondary Ion Mass Spectrometer, fitted with a Quadrupole Mass Analyser. The instrument is configured with a standard sample transfer stage capable of handling a single sample stub. The instrument may be operated in either expert mode, or operator mode. The system comes complete with acquisition software and PC. Negative and Positive ion spectra acquisition, chemical distribution image acquisition and depth profiling of surface modification are the main features of the instrument.

Applications: Except powder sample, characterization of both conducting and nonconducting sample surface is possible to a certain nanometer level.
Location: SMITA Research Labs, IIT Delhi, Hauz Khas.

Contact Person: Mr. Prasant K. Panda
Charges: As applicable