Field Emission Scanning Electron Microscope with EDS


JEOL Model JSM-7900F Prime with Oxford-EDS system IE 250 X Max 150, Netherlands

Features


JEOL’s Model JSM-7900F Prime Field Emission SEM is a uniquely flexible platform that combines the ultimate in high resolution imaging with unparalleled nano scale microanalysis. It can be switched between four modes enabling the investigation of conductive and non-conductive materials. It consist of Super Hybrid Lens (SHL), a combination of electrostatic and electromagnetic lenses, to support ultrahigh resolution imaging and analysis of various samples ranging from magnetic materials to insulators. Also, In-lens Schottky Plus field emission electron gun and low aberration condenser lens provide higher levels of brightness. Moreover, ample probe current is available at low accelerating voltage, supporting various applications from high resolution imaging to high speed elemental mapping. Various energy filters are also available which help in freely selection of information from the specimen surface.


Performance
  • Four modes- SEM, LDF, GB and GBSH modes
  • Gentle Beam (GB) and Gentle Beam Super High mode (GBSH) enable a bias voltage of 2 kV up to 5 kV
  • Upper Electron Detector (UED), Lower Electron Detector (LED), Upper Secondary detector (USED) and Retractable Back scatter Electron Detector (RBSED), STEM detector are also incorporated
  • Manual user interface, Energy Dispersive Spectroscopy (EDS) with 150 mm2 SDD detector can be used in point & ID, analyzer and mapping mode
  • Resolution-0.7nm @ 15kV & 0.7nm @ 1kV (Gentle beam).
Applications
  • Surface morphology of all kinds of conductive and non-conductive samples including nano to micro scale structures, films, ceramics etc. can be analyzed
  • Texture information by performing phase identification through RBSED
  • Elemental detection and orientation mapping can be done by EDS
Sample Specifications
  • Conductive and non-conductive solid samples can be analyzed under SEM
  • Non-conductive samples can be analyzed after being sputtered either with gold, platinum or silver.
  • Maximum sample height and diameter that can be analyzed is 50 mm and 150 mm respectively
  • Height: 1 - 1.5 cm
  • Minimum amount required for analysis 
    • 5 mg for powder sample
    • 1X1 cm2 for films
Testing Parameters
  • Magnification: 50X to approx 1,000,000X depending on the nature of the sample
  • Voltage: 0.01 kV to 30 kV
  • Parameters may vary depending upon the nature of the sample
Precautions
  • Samples should not be toxic, reactive or volatile in nature
  • Sample should be well dispersed and vacuum dried
Location: SMITA Analytical Lab, TX-110 A, Dept. of Textile Technology, IIT Delhi