Environmental Scanning Electron Microscope model FEI Quanta 200F with Oxford-EDS system IE 250 X Max 80 

Features:
 The Quanta 200 FEG

uses 
a field-emission gun (FEG) electron source and can be switched between
three vacuum modes enabling the investigation of conductive, non-conductive and high-vacuum incompatible materials. It offers nanometer resolution and a high signal to noise ratio in both regular high vacuum and environmental (wet) modes.
The EDS consists latest 80 mmSDD detector enables detection of elements under high resolution.

Performance: Three vacuum modes, samples can be studied in pressures up to 5 Torr., Wet STEM detector. The Wet STEM provides imaging at relative humidity conditions up to 100%, Manual user interface, EDS with 80 mmSDD detector.

Applications:  Surface morphology of all kinds of conductive and non conductive samples can be analyzed. Texture information by performing phase identification and orientation mapping can  be done by EDS.

                                                                                  Location: SMITA Lab, IIT Delhi, Hauz Khas.
 
                                                                                  Charges: As applicable