Atomic Field Microscope 

MultiView 1000 and 2000TM, from Nanonics Imaging Limited, Israel


                                                                                    


Features
The Nanonics MultiView 2000™
AFM Microscope is the only microscope which allows for both tip and sample scanning. Multiview 1000™ is capable of scanning in a liquid environment as well as solid samples It can be integrated with Raman/FTIR Raman- AFM for taking Raman

spectra simultaneously with AFM scan, Tip enhanced Raman spectroscopy for enhancing Raman signals.

Performance 
  • Olympus microscope with 10X and 50X objectives for higher resolution.
  • Operates in non- contact mode.
  • Capable of tip enhanced Raman spectroscopy.
  • Tip size is 10 nm, so particles cannot be resolved below this dimension.
  • Lateral and axial scan range upto 70 µm for very rough samples.
  • Maximum scan area 70 µm X 70 µm can be done. Minimum 2 µm X 2 µm.
 Applications
  • AFM allow surface morphology characterization of highly irregular surfaces using intermittent modes with information on height, amplitude, error and phase signals.
  • Used for variety of samples such as nanofibers, fabrics, thin films etc.

Sample Specifications

  • For fabrics and yarns as it is samples can be done.
  • For nanoparticles/ Nanodispersions (if nanoparticle disperse in appropriate solvent):
    • 1 wt% gelatine solution should be prepared and applied on the substrate (can be glass coverslip/mica sheet or any other smooth substrate with preferable dimension of 1 cm X 1 cm) as very thin film.
    • Dry at room temp for 2-3 hr.
    • Apply nanoparticle dispersion on it and dry again.
  • Preferable sample size 1 cm X 1 cm.Properly adhered to substrate (glass/mica/silicon).
Points to be noted            
  • SEM Image of same sample is must before AFM
  • Dispersion should not be in form of aggregates.
  • Diluted solutions are preferred for good dispersion and individual particles.
  • Sample should be properly dried. Wet samples can not be done
  • Sample should be adhered properly to substrate and should not stick to tip during scan.
  • Liquid samples can not be done as it is.

Location: SMITA Analytical Lab, TX-110 A, Dept. of Textile Technology, IIT Delhi